'Seeing is believing'
Electron microscopy is one of the most powerful tools in materials investigation, allowing simultaneous high resolution imaging and chemical analysis.
Electron microscope is avaialble in the NanoVision Centre
Make enquiries and complete online bookings via email@example.com
Specimens can be imaged on their surface by scanning electron microscopy (SEM) or internal structure in transmission electron microscopy (TEM).
Sample preparation is important and, in general, samples must be vacuum compatible and, if they are non-conducting, coated with a thin conducting coating.
Our SEMs are a capable of imaging and chemical analysis in multiple environments, including low vacuum conditions, hydrated conditions (ESEM) and cryogenically frozen.
Our focus ion beam microscope (FIB-SEM) allows samples to be cross-sectioned in situ or imaged in 3D (FIB-SEM tomography).
Scanning probe microscopy (SPM) images and investogates material surface by scanning a phyical probe across the surface of the sample
Many tchniques including : AFM, STM, SFM, force-distance, Kelvin probe, in situ AFM in the SEM for nano-mechanics are vaiable in the NanoVision Centre
Light microscopy is also an important technique in materials science. Many advances have been made in the field in recent years including 'super-resolution' techniques such as PALM and STORM
Basic transmission and reflection light microscopes are available in the NanoVision Centre
Other light microscopy centres around QM (Whitechapel and William Harvey)
Confocal, 2 photon, STORM